Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...

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Bibliographic Details
Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moisés (José Moisés) (Author)
Format: Electronic eBook
Language:English
Published: Weinheim : Wiley-VCH, [2014]
Edition:First edition.
Subjects:
Online Access: Full text (Emmanuel users only)