Neutron and x-ray reflectometry : emerging phenomena at heterostructure interfaces /

This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.

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Bibliographic Details
Main Authors: Basu, Saibal (Author), Singh, Surendra (Ph. D. in physics) (Author)
Format: Electronic eBook
Language:English
Published: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
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Online Access: Full text (Emmanuel users only)
Local Note:ProQuest Ebook Central