X-Ray Scattering From Semiconductors (2nd Edition).
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...
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| Main Author: | |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Singapore :
World Scientific,
2003.
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| Online Access: |
Full text (Emmanuel users only) |